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Trace elements in quartz - a combined electron microprobe, secondary ion mass spectrometry, laser-ablation ICP-MS, and cathodoluminescence study

Hits: 837
Year:
2003
Type of Publication:
Artikel
Autoren:
MüLLER, Axel; WIEDENBECK, Michael; van den Kerkhof, Alfons
Journal:
European Journal of Mineralogy
Volume:
15
Nummer:
4
Seiten:
747-763
BibTex:
Kurzzusammenfassung:
We present electron microprobe, secondary ion mass spectrometry, and laser ablation inductively coupled mass spectrometry data for common trace elements (Li, Al, Ti, Na, K, Fe) in quartz. Our samples from both magmatic and hydrothermal environments all show heterogeneity at the single grain scale.Concentrations of Al and Ti determined by EPMA, SIMS, and LA-ICP-MS are in rough agreement and confirm the robustness of these analytical methods. The highest precision data were obtained from SIMS, but this is outweighed by the lack of a high quality quartz reference sample for calibrating this technique. Due to its large sampling volume, laser ablation analyses gave only average values for trace elements in zoned quartz. Because of its better spatial resolution in conjunction with the ability to combine spot analyses with cathodoluminescence imaging EPMA proved the most reliable in situ method for obtaining quantitative trace element data of quartz at concentrations in excess of a few 10's of ppm and at the
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